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Complete Strain Mapping of Nanosheets of Tantalum Disulfide.
Cao Y, Assefa T, Banerjee S, Wieteska A, Zi-Ren Wang D, Pasupathy A, Tong X, Liu Y, Lu W, Sun YP, He Y, Huang X, Yan H, Chu YS, Billinge SJL, Robinson IK. Cao Y, et al. Among authors: yan h. ACS Appl Mater Interfaces. 2020 Sep 23;12(38):43173-43179. doi: 10.1021/acsami.0c06517. Epub 2020 Sep 8. ACS Appl Mater Interfaces. 2020. PMID: 32833418 Free article.
11 nm hard X-ray focus from a large-aperture multilayer Laue lens.
Huang X, Yan H, Nazaretski E, Conley R, Bouet N, Zhou J, Lauer K, Li L, Eom D, Legnini D, Harder R, Robinson IK, Chu YS. Huang X, et al. Among authors: yan h. Sci Rep. 2013 Dec 20;3:3562. doi: 10.1038/srep03562. Sci Rep. 2013. PMID: 24356395 Free PMC article.
Design and performance of a scanning ptychography microscope.
Nazaretski E, Huang X, Yan H, Lauer K, Conley R, Bouet N, Zhou J, Xu W, Eom D, Legnini D, Harder R, Lin CH, Chen YS, Hwu Y, Chu YS. Nazaretski E, et al. Among authors: yan h. Rev Sci Instrum. 2014 Mar;85(3):033707. doi: 10.1063/1.4868968. Rev Sci Instrum. 2014. PMID: 24689592
Optimization of overlap uniformness for ptychography.
Huang X, Yan H, Harder R, Hwu Y, Robinson IK, Chu YS. Huang X, et al. Among authors: yan h. Opt Express. 2014 May 19;22(10):12634-44. doi: 10.1364/OE.22.012634. Opt Express. 2014. PMID: 24921380 Free article.
Pushing the limits: an instrument for hard X-ray imaging below 20 nm.
Nazaretski E, Lauer K, Yan H, Bouet N, Zhou J, Conley R, Huang X, Xu W, Lu M, Gofron K, Kalbfleisch S, Wagner U, Rau C, Chu YS. Nazaretski E, et al. Among authors: yan h. J Synchrotron Radiat. 2015 Mar;22(2):336-41. doi: 10.1107/S1600577514025715. Epub 2015 Jan 28. J Synchrotron Radiat. 2015. PMID: 25723934
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