Design and performance of a scanning ptychography microscope

E Nazaretski; X Huang; H Yan; K Lauer; R Conley; N Bouet; J Zhou; W Xu; D Eom; D Legnini; R Harder; C-H Lin; Y-S Chen; Y Hwu; Y S Chu

doi:10.1063/1.4868968

Design and performance of a scanning ptychography microscope

Rev Sci Instrum. 2014 Mar;85(3):033707. doi: 10.1063/1.4868968.

Authors

E Nazaretski¹, X Huang¹, H Yan¹, K Lauer¹, R Conley¹, N Bouet¹, J Zhou¹, W Xu¹, D Eom¹, D Legnini², R Harder², C-H Lin³, Y-S Chen³, Y Hwu³, Y S Chu¹

Affiliations

¹ Brookhaven National Laboratory, Upton, New York 11973, USA.
² Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
³ Institute of Physics, Academia Sinica, Taipei 11529, Taiwan.

PMID: 24689592
DOI: 10.1063/1.4868968

Abstract

We have designed and constructed a dedicated instrument to perform ptychography measurements and characterization of multilayer Laue lenses nanofocusing optics. The design of the scanning microscope provides stability of components and minimal thermal drifts, requirements for nanometer scale spatial resolution measurements. We performed thorough laboratory characterization of the instrument in terms of resolution and thermal drifts with subsequent measurements at a synchrotron. We have successfully acquired and reconstructed ptychography data yielding 11 nm line focus.