Transport limits in defect-engineered LaAlO3/SrTiO3 bilayers.
Gunkel F, Wicklein S, Hoffmann-Eifert S, Meuffels P, Brinks P, Huijben M, Rijnders G, Waser R, Dittmann R.
Gunkel F, et al. Among authors: waser r.
Nanoscale. 2015 Jan 21;7(3):1013-22. doi: 10.1039/c4nr06272h.
Nanoscale. 2015.
PMID: 25469599