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Profilometry of thin films on rough substrates by Raman spectroscopy.
Ledinský M, Paviet-Salomon B, Vetushka A, Geissbühler J, Tomasi A, Despeisse M, De Wolf S, Ballif C, Fejfar A. Ledinský M, et al. Among authors: vetushka a. Sci Rep. 2016 Dec 6;6:37859. doi: 10.1038/srep37859. Sci Rep. 2016. PMID: 27922033 Free PMC article.
Direct Imaging of Dopant Distribution in Polycrystalline ZnO Films.
Lorenzo F, Aebersold AB, Morales-Masis M, Ledinský M, Escrig S, Vetushka A, Alexander DT, Hessler-Wyser A, Fejfar A, Hébert C, Nicolay S, Ballif C. Lorenzo F, et al. Among authors: vetushka a. ACS Appl Mater Interfaces. 2017 Mar 1;9(8):7241-7248. doi: 10.1021/acsami.6b14350. Epub 2017 Feb 13. ACS Appl Mater Interfaces. 2017. PMID: 28151638
Creating nanocrystals in amorphous silicon using a conductive tip.
Rezek B, Sípek E, Ledinský M, Stuchlík J, Vetushka A, Kocka J. Rezek B, et al. Among authors: vetushka a. Nanotechnology. 2009 Jan 28;20(4):045302. doi: 10.1088/0957-4484/20/4/045302. Epub 2008 Dec 18. Nanotechnology. 2009. PMID: 19417314