Van Aert S - Search Results

1

Interface Pattern Engineering in Core-Shell Upconverting Nanocrystals: Shedding Light on Critical Parameters and Consequences for the Photoluminescence Properties.

Hudry D, De Backer A, Popescu R, Busko D, Howard IA, Bals S, Zhang Y, Pedrazo-Tardajos A, Van Aert S, Gerthsen D, Altantzis T, Richards BS. Hudry D, et al. Among authors: van aert s. Small. 2021 Nov;17(47):e2104441. doi: 10.1002/smll.202104441. Epub 2021 Oct 25. Small. 2021. PMID: 34697908

2

Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range.

Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D. Bals S, et al. Among authors: van tendeloo g, van aert s. Phys Rev Lett. 2006 Mar 10;96(9):096106. doi: 10.1103/PhysRevLett.96.096106. Epub 2006 Mar 10. Phys Rev Lett. 2006. PMID: 16606285

3

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

4

Effect of amorphous layers on the interpretation of restored exit waves.

Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g. Ultramicroscopy. 2009 Feb;109(3):237-46. doi: 10.1016/j.ultramic.2008.10.024. Epub 2008 Nov 14. Ultramicroscopy. 2009. PMID: 19110376

5

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

6

Three-dimensional atomic imaging of colloidal core-shell nanocrystals.

Bals S, Casavola M, van Huis MA, Van Aert S, Batenburg KJ, Van Tendeloo G, Vanmaekelbergh D. Bals S, et al. Among authors: van tendeloo g, van huis ma, van aert s. Nano Lett. 2011 Aug 10;11(8):3420-4. doi: 10.1021/nl201826e. Epub 2011 Jul 27. Nano Lett. 2011. PMID: 21786766

7

High precision measurements of atom column positions using model-based exit wave reconstruction.

De Backer A, Van Aert S, Van Dyck D. De Backer A, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2011 Aug-Oct;111(9-10):1475-82. doi: 10.1016/j.ultramic.2011.07.002. Epub 2011 Jul 27. Ultramicroscopy. 2011. PMID: 21930019

8

Atomic scale dynamics of ultrasmall germanium clusters.

Bals S, Van Aert S, Romero CP, Lauwaet K, Van Bael MJ, Schoeters B, Partoens B, Yücelen E, Lievens P, Van Tendeloo G. Bals S, et al. Among authors: van tendeloo g, van aert s, van bael mj. Nat Commun. 2012 Jun 12;3:897. doi: 10.1038/ncomms1887. Nat Commun. 2012. PMID: 22692540 Free PMC article.

9

Advanced electron microscopy for advanced materials.

Van Tendeloo G, Bals S, Van Aert S, Verbeeck J, Van Dyck D. Van Tendeloo G, et al. Among authors: van dyck d, van aert s. Adv Mater. 2012 Nov 8;24(42):5655-75. doi: 10.1002/adma.201202107. Epub 2012 Aug 21. Adv Mater. 2012. PMID: 22907862 Review.

10

Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations.

De Backer A, Martinez GT, Rosenauer A, Van Aert S. De Backer A, et al. Among authors: van aert s. Ultramicroscopy. 2013 Nov;134:23-33. doi: 10.1016/j.ultramic.2013.05.003. Epub 2013 May 17. Ultramicroscopy. 2013. PMID: 23759467

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