Advanced electron microscopy for advanced materials

Gustaaf Van Tendeloo; Sara Bals; Sandra Van Aert; Jo Verbeeck; Dirk Van Dyck

doi:10.1002/adma.201202107

Advanced electron microscopy for advanced materials

Adv Mater. 2012 Nov 8;24(42):5655-75. doi: 10.1002/adma.201202107. Epub 2012 Aug 21.

Authors

Gustaaf Van Tendeloo¹, Sara Bals, Sandra Van Aert, Jo Verbeeck, Dirk Van Dyck

Affiliation

¹ Electron Microscopy for Materials Research, University of Antwerp, Belgium. staf.vantendeloo@ua.ac.be

PMID: 22907862
DOI: 10.1002/adma.201202107

Abstract

The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces.

Publication types

Research Support, Non-U.S. Gov't
Review

MeSH terms

Imaging, Three-Dimensional
Magnetics
Microscopy, Electron*
Nanoparticles / chemistry*
Tomography