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Preparation of micro-foils for TEM/STEM analysis from metallic powders.
Micron. 2015 Jul;74:54-8. doi: 10.1016/j.micron.2015.04.006. Epub 2015 Apr 23.
Micron. 2015.
PMID: 25967375
Noise reduction in CCD measurements by improving the quality of dark-reference images.
Heil T, Tatlock GJ.
Heil T, et al. Among authors: tatlock gj.
Microscopy (Oxf). 2018 Mar 1;67(suppl_1):i123-i132. doi: 10.1093/jmicro/dfy006.
Microscopy (Oxf). 2018.
PMID: 29447363
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The Effects of Zr Doping on the Optical, Electrical and Microstructural Properties of Thin ZnO Films Deposited by Atomic Layer Deposition.
Herodotou S, Treharne RE, Durose K, Tatlock GJ, Potter RJ.
Herodotou S, et al. Among authors: tatlock gj.
Materials (Basel). 2015 Oct 27;8(10):7230-7240. doi: 10.3390/ma8105369.
Materials (Basel). 2015.
PMID: 28793633
Free PMC article.
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Microanalysis near particles and voids at grain boundaries.
Tatlock GJ, Partridge A, Beahan PG.
Tatlock GJ, et al.
Microsc Res Tech. 1993 Mar 1;24(4):340-7. doi: 10.1002/jemt.1070240407.
Microsc Res Tech. 1993.
PMID: 8513174
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Effect of annealing temperatures on the secondary re-crystallization of extruded PM2000 steel bar.
Chen CL, Tatlock GJ, Jones AR.
Chen CL, et al. Among authors: tatlock gj.
J Microsc. 2009 Mar;233(3):474-81. doi: 10.1111/j.1365-2818.2009.03134.x.
J Microsc. 2009.
PMID: 19250468
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Scanning-tunneling-microscopy investigation of the p(2 x 2) and c(2 x 2) overlayers of S on Ni(100).
Partridge A, Tatlock GJ, Leibsle FM, Flipse CF, Hörmandinger G, Pendry JB.
Partridge A, et al. Among authors: tatlock gj.
Phys Rev B Condens Matter. 1993 Sep 15;48(11):8267-8276. doi: 10.1103/physrevb.48.8267.
Phys Rev B Condens Matter. 1993.
PMID: 10007018
No abstract available.
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