Microanalysis near particles and voids at grain boundaries

Microsc Res Tech. 1993 Mar 1;24(4):340-7. doi: 10.1002/jemt.1070240407.

Abstract

Some of the problems of using high spatial resolution microanalysis in the vicinity of particles and voids in metal grain boundaries are discussed. New analytical results are presented for nickel based alloys, which suggest that elemental distributions in the region immediately adjacent to growing grain boundary particles and voids are often anisotropic.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Electron Probe Microanalysis*
  • Microscopy, Electron, Scanning Transmission