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Retention Improvement of HZO-Based Ferroelectric Capacitors with TiO2 Insets.
Koroleva AA, Chernikova AG, Zarubin SS, Korostylev E, Khakimov RR, Zhuk MY, Markeev AM. Koroleva AA, et al. Among authors: zarubin ss. ACS Omega. 2022 Dec 7;7(50):47084-47095. doi: 10.1021/acsomega.2c06237. eCollection 2022 Dec 20. ACS Omega. 2022. PMID: 36570284 Free PMC article.
Magnetoelectric Coupling at the Ni/Hf0.5Zr0.5O2 Interface.
Dmitriyeva A, Mikheev V, Zarubin S, Chouprik A, Vinai G, Polewczyk V, Torelli P, Matveyev Y, Schlueter C, Karateev I, Yang Q, Chen Z, Tao L, Tsymbal EY, Zenkevich A. Dmitriyeva A, et al. Among authors: zarubin s. ACS Nano. 2021 Sep 28;15(9):14891-14902. doi: 10.1021/acsnano.1c05001. Epub 2021 Sep 1. ACS Nano. 2021. PMID: 34468129
Controlling Charge Transfer from Quantum Dots to Polyelectrolyte Layers Extends Prospective Applications of Magneto-Optical Microcapsules.
Nifontova G, Krivenkov V, Zvaigzne M, Samokhvalov P, Efimov AE, Agapova OI, Agapov II, Korostylev E, Zarubin S, Karaulov A, Nabiev I, Sukhanova A. Nifontova G, et al. Among authors: zarubin s. ACS Appl Mater Interfaces. 2020 Aug 12;12(32):35882-35894. doi: 10.1021/acsami.0c08715. Epub 2020 Jul 29. ACS Appl Mater Interfaces. 2020. PMID: 32663390
Ferroelectric Second-Order Memristor.
Mikheev V, Chouprik A, Lebedinskii Y, Zarubin S, Matveyev Y, Kondratyuk E, Kozodaev MG, Markeev AM, Zenkevich A, Negrov D. Mikheev V, et al. Among authors: zarubin s. ACS Appl Mater Interfaces. 2019 Sep 4;11(35):32108-32114. doi: 10.1021/acsami.9b08189. Epub 2019 Aug 26. ACS Appl Mater Interfaces. 2019. PMID: 31402643
Ferroelectricity in Hf0.5Zr0.5O2 Thin Films: A Microscopic Study of the Polarization Switching Phenomenon and Field-Induced Phase Transformations.
Chouprik A, Zakharchenko S, Spiridonov M, Zarubin S, Chernikova A, Kirtaev R, Buragohain P, Gruverman A, Zenkevich A, Negrov D. Chouprik A, et al. Among authors: zarubin s. ACS Appl Mater Interfaces. 2018 Mar 14;10(10):8818-8826. doi: 10.1021/acsami.7b17482. Epub 2018 Mar 5. ACS Appl Mater Interfaces. 2018. PMID: 29464951
Effect of Polarization Reversal in Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Devices on Electronic Conditions at Interfaces Studied in Operando by Hard X-ray Photoemission Spectroscopy.
Matveyev Y, Negrov D, Chernikova A, Lebedinskii Y, Kirtaev R, Zarubin S, Suvorova E, Gloskovskii A, Zenkevich A. Matveyev Y, et al. Among authors: zarubin s. ACS Appl Mater Interfaces. 2017 Dec 13;9(49):43370-43376. doi: 10.1021/acsami.7b14369. Epub 2017 Nov 30. ACS Appl Mater Interfaces. 2017. PMID: 29160064
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