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Analysis of the stability of InGaN/GaN multiquantum wells against ion beam intermixing.
Redondo-Cubero A, Lorenz K, Wendler E, Magalhães S, Alves E, Carvalho D, Ben T, Morales FM, García R, O'Donnell KP, Wetzel C. Redondo-Cubero A, et al. Among authors: o donnell kp. Nanotechnology. 2015 Oct 23;26(42):425703. doi: 10.1088/0957-4484/26/42/425703. Epub 2015 Sep 30. Nanotechnology. 2015. PMID: 26421745 Free article.
Induced magnetic moment of Eu(3+) ions in GaN.
Kachkanov V, Wallace MJ, van der Laan G, Dhesi SS, Cavill SA, Fujiwara Y, O'Donnell KP. Kachkanov V, et al. Sci Rep. 2012;2:969. doi: 10.1038/srep00969. Epub 2012 Dec 12. Sci Rep. 2012. PMID: 23236589 Free PMC article.
Characterization of nitride thin films by electron backscatter diffraction.
Trager-Cowan C, Sweeney F, Hastie J, Manson-Smith SK, Cowan DA, McColl D, Mohammed A, O'Donnell KP, Zubia D, Hersee SD, Foxon CT, Harrison I, Novikov SV. Trager-Cowan C, et al. J Microsc. 2002 Mar;205(Pt 3):226-30. doi: 10.1046/j.1365-2818.2002.00996.x. J Microsc. 2002. PMID: 11996185
49 results