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Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits.
Sarker MAR, Jung S, Ildefonso A, Khachatrian A, Buchner SP, McMorrow D, Paki P, Cressler JD, Song I. Sarker MAR, et al. Among authors: mcmorrow d. Sensors (Basel). 2020 May 1;20(9):2581. doi: 10.3390/s20092581. Sensors (Basel). 2020. PMID: 32370003 Free PMC article.
Strain control of a bandwidth-driven spin reorientation in Ca3Ru2O7.
Dashwood CD, Walker AH, Kwasigroch MP, Veiga LSI, Faure Q, Vale JG, Porter DG, Manuel P, Khalyavin DD, Orlandi F, Colin CV, Fabelo O, Krüger F, Perry RS, Johnson RD, Green AG, McMorrow DF. Dashwood CD, et al. Among authors: mcmorrow df. Nat Commun. 2023 Oct 4;14(1):6197. doi: 10.1038/s41467-023-41714-8. Nat Commun. 2023. PMID: 37794061 Free PMC article.
107 results