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Deep Learning Extraction of the Temperature-Dependent Parameters of Bulk Defects.
ACS Appl Mater Interfaces. 2022 Nov 2;14(43):48647-48657. doi: 10.1021/acsami.2c12162. Epub 2022 Oct 19.
ACS Appl Mater Interfaces. 2022.
PMID: 36259636
On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon.
Jafari S, Zhu Y, Rougieux F, De Guzman JAT, Markevich VP, Peaker AR, Hameiri Z.
Jafari S, et al. Among authors: hameiri z.
ACS Appl Mater Interfaces. 2021 Feb 10;13(5):6140-6146. doi: 10.1021/acsami.0c17549. Epub 2021 Jan 26.
ACS Appl Mater Interfaces. 2021.
PMID: 33497179
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A Dynamic Calibration Method for Injection-Dependent Charge Carrier Lifetime Measurements.
Zhu Y, Trupke T, Hameiri Z.
Zhu Y, et al. Among authors: hameiri z.
Small Methods. 2021 Sep;5(9):e2100440. doi: 10.1002/smtd.202100440. Epub 2021 Jul 24.
Small Methods. 2021.
PMID: 34928047
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Deep Learning Model to Denoise Luminescence Images of Silicon Solar Cells.
Liu G, Dwivedi P, Trupke T, Hameiri Z.
Liu G, et al. Among authors: hameiri z.
Adv Sci (Weinh). 2023 Jun;10(18):e2300206. doi: 10.1002/advs.202300206. Epub 2023 Apr 24.
Adv Sci (Weinh). 2023.
PMID: 37092559
Free PMC article.
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