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Quartz tuning fork mass change sensing for FIB/SEM technology.
Kunicki P, Moczała-Dusanowska M, Jóźwiak G, Szymanowska P, Piasecki T, Gotszalk T. Kunicki P, et al. Among authors: gotszalk t. Micron. 2020 Feb;129:102792. doi: 10.1016/j.micron.2019.102792. Epub 2019 Nov 21. Micron. 2020. PMID: 31811975
Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopy.
Gacka E, Kunicki P, Łysik P, Gajewski K, Ciechanowicz P, Pucicki D, Majchrzak D, Gotszalk T, Piasecki T, Busani T, Rangelow IW, Hommel D. Gacka E, et al. Among authors: gotszalk t. Ultramicroscopy. 2023 Jun;248:113713. doi: 10.1016/j.ultramic.2023.113713. Epub 2023 Mar 6. Ultramicroscopy. 2023. PMID: 36933435 Free article.
Four-Point Measurement Setup for Correlative Microscopy of Nanowires.
Pruchnik BC, Fidelus JD, Gacka E, Kwoka K, Pruchnik J, Piejko A, Usydus Ł, Zaraska L, Sulka GD, Piasecki T, Gotszalk TP. Pruchnik BC, et al. Among authors: gotszalk tp. Nanomaterials (Basel). 2023 Aug 30;13(17):2451. doi: 10.3390/nano13172451. Nanomaterials (Basel). 2023. PMID: 37686959 Free PMC article.
47 results