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Year | Number of Results |
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2020 | 1 |
2022 | 1 |
2024 | 1 |
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A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress.
Micromachines (Basel). 2024 Apr 5;15(4):503. doi: 10.3390/mi15040503.
Micromachines (Basel). 2024.
PMID: 38675313
Xenon-filled diode performance under influence of low doses of gamma radiation.
Pejović MM, Živanović EN, Stojanović MD.
Pejović MM, et al. Among authors: zivanovic en.
Appl Radiat Isot. 2022 Jun;184:110207. doi: 10.1016/j.apradiso.2022.110207. Epub 2022 Mar 18.
Appl Radiat Isot. 2022.
PMID: 35316779
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INVESTIGATION OF XENON-FILLED TUBE BREAKDOWN VOLTAGE AND DELAY RESPONSE AS POSSIBLE DOSIMETRIC PARAMETERS FOR SMALL GAMMA RAY AIR KERMA RATES.
Pejović M, Živanović E, Živanović M.
Pejović M, et al. Among authors: zivanovic e.
Radiat Prot Dosimetry. 2020 Aug 3;190(1):84-89. doi: 10.1093/rpd/ncaa075.
Radiat Prot Dosimetry. 2020.
PMID: 32744625
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