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Boron Triiodide-Mediated Reduction of Nitroarenes Using Borohydride Reagents.
Org Lett. 2023 Dec 15;25(49):8787-8791. doi: 10.1021/acs.orglett.3c03257. Epub 2023 Dec 5.
Org Lett. 2023.
PMID: 38052021
Free PMC article.
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.
Tyaginov S, O'Sullivan B, Chasin A, Rawal Y, Chiarella T, de Carvalho Cavalcante CT, Kimura Y, Vandemaele M, Ritzenthaler R, Mitard J, Palayam SV, Reifsnider J, Kaczer B.
Tyaginov S, et al. Among authors: chiarella t.
Micromachines (Basel). 2023 Jul 28;14(8):1514. doi: 10.3390/mi14081514.
Micromachines (Basel). 2023.
PMID: 37630050
Free PMC article.
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Sidewall crystalline orientation effect of post-treatments for a replacement metal gate bulk fin field effect transistor.
Lee JW, Simoen E, Veloso A, Cho MJ, Boccardi G, Ragnarsson LÅ, Chiarella T, Horiguchi N, Groeseneken G, Thean A.
Lee JW, et al. Among authors: chiarella t.
ACS Appl Mater Interfaces. 2013 Sep 25;5(18):8865-8. doi: 10.1021/am403270m. Epub 2013 Sep 11.
ACS Appl Mater Interfaces. 2013.
PMID: 24007291
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