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Ellipsometry with randomly varying polarization states.
Liu F, Lee CJ, Chen J, Louis E, van der Slot PJ, Boller KJ, Bijkerk F. Liu F, et al. Among authors: bijkerk f. Opt Express. 2012 Jan 16;20(2):870-8. doi: 10.1364/OE.20.000870. Opt Express. 2012. PMID: 22274433 Free article.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Among authors: bijkerk f. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
57 results