Balboni R - Search Results

1

Measuring the orbital angular momentum spectrum of an electron beam.

Grillo V, Tavabi AH, Venturi F, Larocque H, Balboni R, Gazzadi GC, Frabboni S, Lu PH, Mafakheri E, Bouchard F, Dunin-Borkowski RE, Boyd RW, Lavery MPJ, Padgett MJ, Karimi E. Grillo V, et al. Among authors: balboni r. Nat Commun. 2017 May 24;8:15536. doi: 10.1038/ncomms15536. Nat Commun. 2017. PMID: 28537248 Free PMC article.

2

Observation of nanoscale magnetic fields using twisted electron beams.

Grillo V, Harvey TR, Venturi F, Pierce JS, Balboni R, Bouchard F, Carlo Gazzadi G, Frabboni S, Tavabi AH, Li ZA, Dunin-Borkowski RE, Boyd RW, McMorran BJ, Karimi E. Grillo V, et al. Among authors: balboni r. Nat Commun. 2017 Sep 25;8(1):689. doi: 10.1038/s41467-017-00829-5. Nat Commun. 2017. PMID: 28947803 Free PMC article.

3

Generation and application of bessel beams in electron microscopy.

Grillo V, Harris J, Gazzadi GC, Balboni R, Mafakheri E, Dennis MR, Frabboni S, Boyd RW, Karimi E. Grillo V, et al. Among authors: balboni r. Ultramicroscopy. 2016 Jul;166:48-60. doi: 10.1016/j.ultramic.2016.03.009. Epub 2016 Mar 26. Ultramicroscopy. 2016. PMID: 27203186

4

Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy.

Grillo V, Tavabi AH, Yucelen E, Lu PH, Venturi F, Larocque H, Jin L, Savenko A, Gazzadi GC, Balboni R, Frabboni S, Tiemeijer P, Dunin-Borkowski RE, Karimi E. Grillo V, et al. Among authors: balboni r. Opt Express. 2017 Sep 4;25(18):21851-21860. doi: 10.1364/OE.25.021851. Opt Express. 2017. PMID: 29041477 Free article.

5

Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles.

Spessot A, Frabboni S, Balboni R, Armigliato A. Spessot A, et al. Among authors: balboni r. J Microsc. 2007 May;226(Pt 2):140-55. doi: 10.1111/j.1365-2818.2007.01760.x. J Microsc. 2007. PMID: 17444943

6

Dynamical simulation of LACBED patterns in cross-sectioned heterostructures.

Wu F, Armigliato A, Balboni R, Frabboni S. Wu F, et al. Among authors: balboni r. Micron. 2000 Jun;31(3):211-6. doi: 10.1016/s0968-4328(99)00085-2. Micron. 2000. PMID: 10702968

7

TEM/CBED determination of strain in silicon-based submicrometric electronic devices.

Armigliato A, Balboni R, Balboni S, Frabboni S, Tixier A, Carnevale GP, Colpani P, Pavia G, Marmiroli A. Armigliato A, et al. Among authors: balboni r, balboni s. Micron. 2000 Jun;31(3):203-9. doi: 10.1016/s0968-4328(99)00084-0. Micron. 2000. PMID: 10702967

8

Quantitative thin-film x-ray microanalysis by STEM/HAADF: statistical analysis for precision and accuracy determination.

Armigliato A, Balboni R, Rosa R. Armigliato A, et al. Among authors: balboni r. Microsc Microanal. 2006 Aug;12(4):318-21. doi: 10.1017/S1431927606060405. Microsc Microanal. 2006. PMID: 16842645

9

Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin films.

Armigliato A, Balboni R, Rosa R. Armigliato A, et al. Among authors: balboni r. J Microsc. 2007 Oct;228(Pt 1):1-10. doi: 10.1111/j.1365-2818.2007.01817.x. J Microsc. 2007. PMID: 17910692

10

Cerofolini GF, Meda L, Balboni R, Corni F, Frabboni S, Ottaviani G, Tonini R, Anderle M, Canteri R. Cerofolini GF, et al. Among authors: balboni r. Phys Rev B Condens Matter. 1992 Jul 15;46(4):2061-2070. doi: 10.1103/physrevb.46.2061. Phys Rev B Condens Matter. 1992. PMID: 10003881 No abstract available.

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