Height drift correction in non-raster atomic force microscopy.
Meyer TR, Ziegler D, Brune C, Chen A, Farnham R, Huynh N, Chang JM, Bertozzi AL, Ashby PD.
Meyer TR, et al. Among authors: ashby pd.
Ultramicroscopy. 2014 Feb;137:48-54. doi: 10.1016/j.ultramic.2013.10.014. Epub 2013 Nov 4.
Ultramicroscopy. 2014.
PMID: 24295799
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