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Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.
Data Brief. 2015 Nov 6;5:926-8. doi: 10.1016/j.dib.2015.10.026. eCollection 2015 Dec.
Data Brief. 2015.
PMID: 26702423
Free PMC article.
The Effects of Zr Doping on the Optical, Electrical and Microstructural Properties of Thin ZnO Films Deposited by Atomic Layer Deposition.
Herodotou S, Treharne RE, Durose K, Tatlock GJ, Potter RJ.
Herodotou S, et al. Among authors: treharne re.
Materials (Basel). 2015 Oct 27;8(10):7230-7240. doi: 10.3390/ma8105369.
Materials (Basel). 2015.
PMID: 28793633
Free PMC article.
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