Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Laurie J Phillips; Atef M Rashed; Robert E Treharne; James Kay; Peter Yates; Ivona Z Mitrovic; Ayendra Weerakkody; Steve Hall; Ken Durose

doi:10.1016/j.dib.2015.10.026

Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Data Brief. 2015 Nov 6:5:926-8. doi: 10.1016/j.dib.2015.10.026. eCollection 2015 Dec.

Authors

Laurie J Phillips¹, Atef M Rashed¹, Robert E Treharne¹, James Kay¹, Peter Yates¹, Ivona Z Mitrovic², Ayendra Weerakkody², Steve Hall², Ken Durose¹

Affiliations

¹ Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK.
² Department of Electrical Engineering and Electronics, University of Liverpool, Brownlow Hill, Liverpool L69 3GJ, UK.

Abstract

Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.