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Page 1
Impact of Line Edge Roughness on ReRAM Uniformity and Scaling.
Materials (Basel). 2019 Nov 30;12(23):3972. doi: 10.3390/ma12233972.
Materials (Basel). 2019.
PMID: 31801205
Free PMC article.
Graphene-Modified Interface Controls Transition from VCM to ECM Switching Modes in Ta/TaOx Based Memristive Devices.
Lübben M, Karakolis P, Ioannou-Sougleridis V, Normand P, Dimitrakis P, Valov I.
Lübben M, et al. Among authors: karakolis p.
Adv Mater. 2015 Oct 28;27(40):6202-7. doi: 10.1002/adma.201502574. Epub 2015 Sep 10.
Adv Mater. 2015.
PMID: 26456484
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