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Year | Number of Results |
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2012 | 2 |
2013 | 2 |
2020 | 1 |
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Page 1
Study of the surface species during thermal and plasma-enhanced atomic layer deposition of titanium oxide films using in situ IR-spectroscopy and in vacuo X-ray photoelectron spectroscopy.
Phys Chem Chem Phys. 2020 May 6;22(17):9262-9271. doi: 10.1039/d0cp00395f.
Phys Chem Chem Phys. 2020.
PMID: 32307490
Atomic layer deposition of TiO2 on surface modified nanoporous low-k films.
Levrau E, Devloo-Casier K, Dendooven J, Ludwig KF, Verdonck P, Meersschaut J, Baklanov MR, Detavernier C.
Levrau E, et al.
Langmuir. 2013 Oct 1;29(39):12284-9. doi: 10.1021/la4027738. Epub 2013 Sep 17.
Langmuir. 2013.
PMID: 24000800
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Selective and reversible ammonia gas detection with nanoporous film functionalized silicon photonic micro-ring resonator.
Yebo NA, Sree SP, Levrau E, Detavernier C, Hens Z, Martens JA, Baets R.
Yebo NA, et al. Among authors: levrau e.
Opt Express. 2012 May 21;20(11):11855-62. doi: 10.1364/OE.20.011855.
Opt Express. 2012.
PMID: 22714172
Free article.
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In situ monitoring of atomic layer deposition in nanoporous thin films using ellipsometric porosimetry.
Dendooven J, Devloo-Casier K, Levrau E, Van Hove R, Sree SP, Baklanov MR, Martens JA, Detavernier C.
Dendooven J, et al. Among authors: levrau e.
Langmuir. 2012 Feb 28;28(8):3852-9. doi: 10.1021/la300045z. Epub 2012 Feb 15.
Langmuir. 2012.
PMID: 22304361
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Pore Narrowing of Mesoporous Silica Materials.
Goethals F, Levrau E, De Canck E, Baklanov MR, Detavernier C, Van Driessche I, Van Der Voort P.
Goethals F, et al. Among authors: levrau e.
Materials (Basel). 2013 Feb 20;6(2):570-579. doi: 10.3390/ma6020570.
Materials (Basel). 2013.
PMID: 28809327
Free PMC article.
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