Thomas O - Search Results

1

Nanometer scale assessment of mechanical strain induced in silicon by a periodic line array.

Escoubas S, Gaudeau G, Ezzaidi Y, Thomas O, Morin P. Escoubas S, et al. Among authors: thomas o. J Nanosci Nanotechnol. 2011 Oct;11(10):9160-6. doi: 10.1166/jnn.2011.4292. J Nanosci Nanotechnol. 2011. PMID: 22400317

2

Retrieval of the atomic displacements in the crystal from the coherent X-ray diffraction pattern.

Minkevich AA, Köhl M, Escoubas S, Thomas O, Baumbach T. Minkevich AA, et al. Among authors: thomas o. J Synchrotron Radiat. 2014 Jul;21(Pt 4):774-83. doi: 10.1107/S1600577514010108. Epub 2014 Jun 3. J Synchrotron Radiat. 2014. PMID: 24971974

3

Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling.

Tholapi R, Gallard M, Burle N, Guichet C, Escoubas S, Putero M, Mocuta C, Richard MI, Chahine R, Sabbione C, Bernard M, Fellouh L, Noé P, Thomas O. Tholapi R, et al. Among authors: thomas o. Nanomaterials (Basel). 2020 Jun 26;10(6):1247. doi: 10.3390/nano10061247. Nanomaterials (Basel). 2020. PMID: 32604948 Free PMC article.

4

Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching.

Aliouat MY, Ksenzov D, Escoubas S, Ackermann J, Thiaudière D, Mocuta C, Benoudia MC, Duche D, Thomas O, Grigorian S. Aliouat MY, et al. Among authors: thomas o. Materials (Basel). 2020 Jul 10;13(14):3092. doi: 10.3390/ma13143092. Materials (Basel). 2020. PMID: 32664316 Free PMC article.

5

Piezoelectric Properties of Pb_1-xLa_x(Zr_0.52Ti_0.48)_1-x/4O₃ Thin Films Studied by In Situ X-ray Diffraction.

Cornelius TW, Mocuta C, Escoubas S, Lima LRM, Araújo EB, Kholkin AL, Thomas O. Cornelius TW, et al. Among authors: thomas o. Materials (Basel). 2020 Jul 27;13(15):3338. doi: 10.3390/ma13153338. Materials (Basel). 2020. PMID: 32727047 Free PMC article.

6

Crystallographic Anisotropy Dependence of Interfacial Sliding Phenomenon in a Cu(16)/Nb(16) ARB (Accumulated Rolling Bonding) Nanolaminate.

Sahay R, Budiman AS, Aziz I, Navarro E, Escoubas S, Cornelius TW, Gunawan FE, Harito C, Lee PS, Thomas O, Raghavan N. Sahay R, et al. Among authors: thomas o. Nanomaterials (Basel). 2022 Jan 18;12(3):308. doi: 10.3390/nano12030308. Nanomaterials (Basel). 2022. PMID: 35159654 Free PMC article.

7

In situ three-dimensional reciprocal-space mapping during mechanical deformation.

Cornelius TW, Davydok A, Jacques VL, Grifone R, Schülli T, Richard MI, Beutier G, Verdier M, Metzger TH, Pietsch U, Thomas O. Cornelius TW, et al. Among authors: thomas o. J Synchrotron Radiat. 2012 Sep;19(Pt 5):688-94. doi: 10.1107/S0909049512023758. Epub 2012 Jul 7. J Synchrotron Radiat. 2012. PMID: 22898946

8

Effect of non-ideal clamping shape on the resonance frequencies of silicon nanocantilevers.

Guillon S, Saya D, Mazenq L, Perisanu S, Vincent P, Lazarus A, Thomas O, Nicu L. Guillon S, et al. Among authors: thomas o. Nanotechnology. 2011 Jun 17;22(24):245501. doi: 10.1088/0957-4484/22/24/245501. Epub 2011 Apr 20. Nanotechnology. 2011. PMID: 21508453

9

Scanning force microscope for in situ nanofocused X-ray diffraction studies.

Ren Z, Mastropietro F, Davydok A, Langlais S, Richard MI, Furter JJ, Thomas O, Dupraz M, Verdier M, Beutier G, Boesecke P, Cornelius TW. Ren Z, et al. Among authors: thomas o. J Synchrotron Radiat. 2014 Sep;21(Pt 5):1128-33. doi: 10.1107/S1600577514014532. Epub 2014 Aug 6. J Synchrotron Radiat. 2014. PMID: 25178002 Free PMC article.

10

Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging.

Richard MI , Fernández S , Eymery J , Hofmann JP , Gao L , Carnis J , Labat S , Favre-Nicolin V , Hensen EJM , Thomas O , Schülli TU , Leake SJ . Richard MI , et al. Among authors: thomas o. Nanoscale. 2018 Mar 8;10(10):4833-4840. doi: 10.1039/c7nr07990g. Nanoscale. 2018. PMID: 29473085

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