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Portable x-ray fluorescence spectrometer for coating thickness measurement.
Rev Sci Instrum. 2007 Dec;78(12):123109. doi: 10.1063/1.2822613.
Rev Sci Instrum. 2007.
PMID: 18163722
Free article.
Quantitative Accelerated Life Testing of MEMS Accelerometers.
Bâzu M, Gălăţeanu L, Ilian VE, Loicq J, Habraken S, Collette JP.
Bâzu M, et al. Among authors: collette jp.
Sensors (Basel). 2007 Nov 20;7(11):2846-2859. doi: 10.3390/s7112846.
Sensors (Basel). 2007.
PMID: 28903265
Free PMC article.
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Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination.
Avilov A, Kuligin K, Nicolopoulos S, Nickolskiy M, Boulahya K, Portillo J, Lepeshov G, Sobolev B, Collette JP, Martin N, Robins AC, Fischione P.
Avilov A, et al. Among authors: collette jp.
Ultramicroscopy. 2007 Jun-Jul;107(6-7):431-44. doi: 10.1016/j.ultramic.2006.09.006. Epub 2006 Dec 20.
Ultramicroscopy. 2007.
PMID: 17258859
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