Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction.
Dzhigaev D, Svensson J, Krishnaraja A, Zhu Z, Ren Z, Liu Y, Kalbfleisch S, Björling A, Lenrick F, Balogh ZI, Hammarberg S, Wallentin J, Timm R, Wernersson LE, Mikkelsen A.
Dzhigaev D, et al. Among authors: timm r.
Nanoscale. 2022 Mar 31;14(13):5247. doi: 10.1039/d2nr90060b.
Nanoscale. 2022.
PMID: 35319063