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High Temperature and Power Dependent Photoluminescence Analysis on Commercial Lighting and Display LED Materials for Future Power Electronic Modules.
Sci Rep. 2019 Nov 14;9(1):16758. doi: 10.1038/s41598-019-52126-4.
Sci Rep. 2019.
PMID: 31728031
Free PMC article.
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques.
Gallagher JC, Ebrish MA, Porter MA, Jacobs AG, Gunning BP, Kaplar RJ, Hobart KD, Anderson TJ.
Gallagher JC, et al. Among authors: kaplar rj.
Sci Rep. 2022 Jan 13;12(1):658. doi: 10.1038/s41598-021-04170-2.
Sci Rep. 2022.
PMID: 35027582
Free PMC article.
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Detecting defects that reduce breakdown voltage using machine learning and optical profilometry.
Gallagher JC, Mastro MA, Jacobs AG, Kaplar RJ, Hobart KD, Anderson TJ.
Gallagher JC, et al. Among authors: kaplar rj.
Sci Rep. 2024 Mar 28;14(1):7440. doi: 10.1038/s41598-024-57875-5.
Sci Rep. 2024.
PMID: 38548848
Free PMC article.
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Using machine learning with optical profilometry for GaN wafer screening.
Gallagher JC, Mastro MA, Ebrish MA, Jacobs AG, Gunning BP, Kaplar RJ, Hobart KD, Anderson TJ.
Gallagher JC, et al. Among authors: kaplar rj.
Sci Rep. 2023 Feb 27;13(1):3352. doi: 10.1038/s41598-023-29107-9.
Sci Rep. 2023.
PMID: 36849490
Free PMC article.
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