Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction.
Dzhigaev D, Svensson J, Krishnaraja A, Zhu Z, Ren Z, Liu Y, Kalbfleisch S, Björling A, Lenrick F, Balogh ZI, Hammarberg S, Wallentin J, Timm R, Wernersson LE, Mikkelsen A.
Dzhigaev D, et al. Among authors: balogh zi.
Nanoscale. 2020 Jul 16;12(27):14487-14493. doi: 10.1039/d0nr02260h.
Nanoscale. 2020.
PMID: 32530025