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Integrated 64 pixel UV image sensor and readout in a silicon carbide CMOS technology.
Microsyst Nanoeng. 2022 Oct 25;8:114. doi: 10.1038/s41378-022-00446-3. eCollection 2022.
Microsyst Nanoeng. 2022.
PMID: 36304906
Free PMC article.
Mechanisms of Ohmic Contact Formation of Ti/Al-Based Metal Stacks on p-Doped 4H-SiC.
Kocher M, Rommel M, Michałowski PP, Erlbacher T.
Kocher M, et al. Among authors: erlbacher t.
Materials (Basel). 2021 Dec 22;15(1):50. doi: 10.3390/ma15010050.
Materials (Basel). 2021.
PMID: 35009196
Free PMC article.
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The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors.
Besendörfer S, Meissner E, Medjdoub F, Derluyn J, Friedrich J, Erlbacher T.
Besendörfer S, et al. Among authors: erlbacher t.
Sci Rep. 2020 Oct 14;10(1):17252. doi: 10.1038/s41598-020-73977-2.
Sci Rep. 2020.
PMID: 33057086
Free PMC article.
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