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Probing Interface Defects in Top-Gated MoS2 Transistors with Impedance Spectroscopy.
Zhao P, Azcatl A, Gomeniuk YY, Bolshakov P, Schmidt M, McDonnell SJ, Hinkle CL, Hurley PK, Wallace RM, Young CD. Zhao P, et al. Among authors: young cd. ACS Appl Mater Interfaces. 2017 Jul 19;9(28):24348-24356. doi: 10.1021/acsami.7b06204. Epub 2017 Jul 6. ACS Appl Mater Interfaces. 2017. PMID: 28650155
Stress-Induced Crystallization of Thin Hf1- XZr XO2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic Energy Storage Applications.
Kim SJ, Mohan J, Lee JS, Kim HS, Lee J, Young CD, Colombo L, Summerfelt SR, San T, Kim J. Kim SJ, et al. Among authors: young cd. ACS Appl Mater Interfaces. 2019 Feb 6;11(5):5208-5214. doi: 10.1021/acsami.8b17211. Epub 2019 Jan 28. ACS Appl Mater Interfaces. 2019. PMID: 30652846