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Page 1
Using machine learning with optical profilometry for GaN wafer screening.
Sci Rep. 2023 Feb 27;13(1):3352. doi: 10.1038/s41598-023-29107-9.
Sci Rep. 2023.
PMID: 36849490
Free PMC article.
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques.
Gallagher JC, Ebrish MA, Porter MA, Jacobs AG, Gunning BP, Kaplar RJ, Hobart KD, Anderson TJ.
Gallagher JC, et al. Among authors: jacobs ag.
Sci Rep. 2022 Jan 13;12(1):658. doi: 10.1038/s41598-021-04170-2.
Sci Rep. 2022.
PMID: 35027582
Free PMC article.
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Ultrafast Self-Assembly of Sub-10 nm Block Copolymer Nanostructures by Solvent-Free High-Temperature Laser Annealing.
Jiang J, Jacobs AG, Wenning B, Liedel C, Thompson MO, Ober CK.
Jiang J, et al. Among authors: jacobs ag.
ACS Appl Mater Interfaces. 2017 Sep 20;9(37):31317-31324. doi: 10.1021/acsami.7b00774. Epub 2017 Jun 9.
ACS Appl Mater Interfaces. 2017.
PMID: 28598156
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Lateral Temperature-Gradient Method for High-Throughput Characterization of Material Processing by Millisecond Laser Annealing.
Bell RT, Jacobs AG, Sorg VC, Jung B, Hill MO, Treml BE, Thompson MO.
Bell RT, et al. Among authors: jacobs ag.
ACS Comb Sci. 2016 Sep 12;18(9):548-58. doi: 10.1021/acscombsci.6b00043. Epub 2016 Jul 13.
ACS Comb Sci. 2016.
PMID: 27385487
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μ-Rainbow: CdSe Nanocrystal Photoluminescence Gradients via Laser Spike Annealing for Kinetic Investigations and Tunable Device Design.
Treml BE, Jacobs AG, Bell RT, Thompson MO, Hanrath T.
Treml BE, et al. Among authors: jacobs ag.
Nano Lett. 2016 Feb 10;16(2):967-72. doi: 10.1021/acs.nanolett.5b03918. Epub 2015 Nov 18.
Nano Lett. 2016.
PMID: 26536402
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Detecting defects that reduce breakdown voltage using machine learning and optical profilometry.
Gallagher JC, Mastro MA, Jacobs AG, Kaplar RJ, Hobart KD, Anderson TJ.
Gallagher JC, et al. Among authors: jacobs ag.
Sci Rep. 2024 Mar 28;14(1):7440. doi: 10.1038/s41598-024-57875-5.
Sci Rep. 2024.
PMID: 38548848
Free PMC article.
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