Gottwald A - Search Results

1

An X-ray gas monitor for free-electron lasers.

Sorokin AA, Bican Y, Bonfigt S, Brachmanski M, Braune M, Jastrow UF, Gottwald A, Kaser H, Richter M, Tiedtke K. Sorokin AA, et al. Among authors: gottwald a. J Synchrotron Radiat. 2019 Jul 1;26(Pt 4):1092-1100. doi: 10.1107/S1600577519005174. Epub 2019 Jun 12. J Synchrotron Radiat. 2019. PMID: 31274432 Free PMC article.

2

Metrology of pulsed radiation for 157-nm lithography.

Richter M, Kroth U, Gottwald A, Gerth C, Tiedtke K, Saito T, Tassy I, Vogler K. Richter M, et al. Among authors: gottwald a. Appl Opt. 2002 Dec 1;41(34):7167-72. doi: 10.1364/ao.41.007167. Appl Opt. 2002. PMID: 12477104

3

Absolute measurement of F2-laser power at 157 nm.

Kück S, Brandt F, Kremling HA, Gottwald A, Hoehl A, Richter M. Kück S, et al. Among authors: gottwald a. Appl Opt. 2006 May 10;45(14):3325-30. doi: 10.1364/ao.45.003325. Appl Opt. 2006. PMID: 16676038

4

Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation.

Gottwald A, Bridou F, Cuniot-Ponsard M, Desvignes JM, Kroth S, Kroth U, Paustian W, Richter M, Schöppe H, Thornagel R. Gottwald A, et al. Appl Opt. 2007 Nov 10;46(32):7797-804. doi: 10.1364/ao.46.007797. Appl Opt. 2007. PMID: 17994127

5

A synchrotron-radiation-based variable angle ellipsometer for the visible to vacuum ultraviolet spectral range.

Neumann MD, Cobet C, Kaser H, Kolbe M, Gottwald A, Richter M, Esser N. Neumann MD, et al. Among authors: gottwald a. Rev Sci Instrum. 2014 May;85(5):055117. doi: 10.1063/1.4878919. Rev Sci Instrum. 2014. PMID: 24880425

6

Exploring three-dimensional orbital imaging with energy-dependent photoemission tomography.

Weiß S, Lüftner D, Ules T, Reinisch EM, Kaser H, Gottwald A, Richter M, Soubatch S, Koller G, Ramsey MG, Tautz FS, Puschnig P. Weiß S, et al. Among authors: gottwald a. Nat Commun. 2015 Oct 5;6:8287. doi: 10.1038/ncomms9287. Nat Commun. 2015. PMID: 26437297 Free PMC article.

7

Irradiation-induced degradation of PTB7 investigated by valence band and S 2p photoelectron spectroscopy.

Darlatt E, Muhsin B, Roesch R, Lupulescu C, Roth F, Kolbe M, Gottwald A, Hoppe H, Richter M. Darlatt E, et al. Among authors: gottwald a. Nanotechnology. 2016 Aug 12;27(32):324005. doi: 10.1088/0957-4484/27/32/324005. Epub 2016 Jul 1. Nanotechnology. 2016. PMID: 27363480

8

Uncertainty analysis for the determination of B₄C optical constants by angle-dependent reflectance measurement for 40 nm to 80 nm wavelength.

Gottwald A, Wiese K, Kroth U, Richter M. Gottwald A, et al. Appl Opt. 2017 Jul 10;56(20):5768-5774. doi: 10.1364/AO.56.005768. Appl Opt. 2017. PMID: 29047720

9

Transverse resonance island buckets for synchrotron-radiation based electron time-of-flight spectroscopy.

Arion T, Eberhardt W, Feikes J, Gottwald A, Goslawski P, Hoehl A, Kaser H, Kolbe M, Li J, Lupulescu C, Richter M, Ries M, Roth F, Ruprecht M, Tydecks T, Wüstefeld G. Arion T, et al. Among authors: gottwald a. Rev Sci Instrum. 2018 Oct;89(10):103114. doi: 10.1063/1.5046923. Rev Sci Instrum. 2018. PMID: 30399919

10

The U125 insertion device beamline at the Metrology Light Source.

Gottwald A, Kaser H, Kolbe M. Gottwald A, et al. J Synchrotron Radiat. 2019 Mar 1;26(Pt 2):535-542. doi: 10.1107/S1600577518018428. Epub 2019 Feb 6. J Synchrotron Radiat. 2019. PMID: 30855265

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