Conductive AFM for CNT characterization.
Toader M, Fiedler H, Hermann S, Schulz SE, Gessner T, Hietschold M.
Toader M, et al. Among authors: schulz se.
Nanoscale Res Lett. 2013 Jan 11;8(1):24. doi: 10.1186/1556-276X-8-24.
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PMID: 23311434
Free PMC article.