Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane

C Himcinschi; M Friedrich; S Frühauf; I Streiter; S E Schulz; T Gessner; M R Baklanov; K P Mogilnikov; D R T Zahn

doi:10.1007/s00216-002-1392-x

Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane

Anal Bioanal Chem. 2002 Oct;374(4):654-7. doi: 10.1007/s00216-002-1392-x. Epub 2002 Jul 30.

Authors

C Himcinschi¹, M Friedrich, S Frühauf, I Streiter, S E Schulz, T Gessner, M R Baklanov, K P Mogilnikov, D R T Zahn

Affiliation

¹ Institut für Physik, Technische Universität Chemnitz, 09107 Chemnitz, Germany. cahi@physik.tu-chemnitz.de

PMID: 12397487
DOI: 10.1007/s00216-002-1392-x

Abstract

Variable angle spectroscopic ellipsometry (VASE) and ellipsometric porosimetry (EP) have been used to study the effect of treatment with hexamethyldisilazane (HMDS) on the porosity of silica xerogel films. Chemical modification of the surface with HMDS was found to reduce the porosity by approximately 15%. This reduction was connected with changes which occur in the silica network, with further condensation or the reaction between neighbouring trimethylsilyl (TMS) surface groups being possible causes.