In situ studies on defect formation dynamics in flash-sintered TiO2.
Xue S, Li Phuah X, Jian J, Li Q, Li J, Yang B, Zhang D, Wang H, Tsakalakos T, Mukherjee AK, Wang H, Zhang X.
Xue S, et al. Among authors: mukherjee ak.
Nanoscale. 2023 Oct 26;15(41):16752-16765. doi: 10.1039/d3nr02630b.
Nanoscale. 2023.
PMID: 37817681