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Rodríguez-Sota A, Saxena V, Spethmann J, Wiesendanger R, Lo Conte R, Kubetzka A, von Bergmann K.Rodríguez-Sota A, et al. Among authors: von bergmann k.ACS Nano. 2024 Jan 30;18(4):3699-3706. doi: 10.1021/acsnano.3c11459. Epub 2024 Jan 16.ACS Nano. 2024.PMID: 38227829Free PMC article.
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von Bergmann K, Menzel M, Kubetzka A, Wiesendanger R.von Bergmann K, et al.Nano Lett. 2015 May 13;15(5):3280-5. doi: 10.1021/acs.nanolett.5b00506. Epub 2015 Apr 15.Nano Lett. 2015.PMID: 25859818
Palacio-Morales A, Kubetzka A, von Bergmann K, Wiesendanger R.Palacio-Morales A, et al. Among authors: von bergmann k.Nano Lett. 2016 Oct 12;16(10):6252-6256. doi: 10.1021/acs.nanolett.6b02528. Epub 2016 Sep 21.Nano Lett. 2016.PMID: 27632358
Hagemeister J, Iaia D, Vedmedenko EY, von Bergmann K, Kubetzka A, Wiesendanger R.Hagemeister J, et al. Among authors: von bergmann k.Phys Rev Lett. 2016 Nov 11;117(20):207202. doi: 10.1103/PhysRevLett.117.207202. Epub 2016 Nov 10.Phys Rev Lett. 2016.PMID: 27886488
Spethmann J, Meyer S, von Bergmann K, Wiesendanger R, Heinze S, Kubetzka A.Spethmann J, et al. Among authors: von bergmann k.Phys Rev Lett. 2020 Jun 5;124(22):227203. doi: 10.1103/PhysRevLett.124.227203.Phys Rev Lett. 2020.PMID: 32567896
Spethmann J, Grünebohm M, Wiesendanger R, von Bergmann K, Kubetzka A.Spethmann J, et al. Among authors: von bergmann k.Nat Commun. 2021 Jun 9;12(1):3488. doi: 10.1038/s41467-021-23760-2.Nat Commun. 2021.PMID: 34108461Free PMC article.
Kubetzka A, Ferriani P, Bode M, Heinze S, Bihlmayer G, von Bergmann K, Pietzsch O, Blügel S, Wiesendanger R.Kubetzka A, et al. Among authors: von bergmann k.Phys Rev Lett. 2005 Mar 4;94(8):087204. doi: 10.1103/PhysRevLett.94.087204. Epub 2005 Mar 3.Phys Rev Lett. 2005.PMID: 15783926Free article.
Bode M, Kubetzka A, Von Bergmann K, Pietzsch O, Wiesendanger R.Bode M, et al. Among authors: von bergmann k.Microsc Res Tech. 2005 Feb;66(2-3):117-25. doi: 10.1002/jemt.20151.Microsc Res Tech. 2005.PMID: 15880495
Von Bergmann K, Bode M, Kubetzka A, Pietzsch O, Wiesendanger R.Von Bergmann K, et al.Microsc Res Tech. 2005 Feb;66(2-3):61-71. doi: 10.1002/jemt.20146.Microsc Res Tech. 2005.PMID: 15880499