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The COMIX polarimeter: a compact device for XUV polarization analysis.
Pancaldi M, Strüber C, Friedrich B, Pedersoli E, De Angelis D, Nikolov IP, Manfredda M, Foglia L, Yulin S, Spezzani C, Sacchi M, Eisebitt S, von Korff Schmising C, Capotondi F. Pancaldi M, et al. Among authors: yulin s. J Synchrotron Radiat. 2022 Jul 1;29(Pt 4):969-977. doi: 10.1107/S1600577522004027. Epub 2022 May 19. J Synchrotron Radiat. 2022. PMID: 35787562 Free PMC article.
Extreme-ultraviolet-induced oxidation of Mo/Si multilayers.
Benoit N, Schröder S, Yulin S, Feigl T, Duparré A, Kaiser N, Tünnermann A. Benoit N, et al. Among authors: yulin s. Appl Opt. 2008 Jul 1;47(19):3455-62. doi: 10.1364/ao.47.003455. Appl Opt. 2008. PMID: 18594592
Thermal stability of soft x-ray Mo-Si and MoSi(2)-Si multilayer mirrors.
Kondratenko VV, Pershin YP, Poltseva OV, Fedorenko AI, Zubarev EN, Yulin SA, Kozhevnikov V, Sagitov SI, Chirkov VA, Levashov VE, Vinogradov AV. Kondratenko VV, et al. Among authors: yulin sa. Appl Opt. 1993 Apr 1;32(10):1811-6. doi: 10.1364/AO.32.001811. Appl Opt. 1993. PMID: 20820316
Schwarzschild soft-x-ray microscope for imaging of nonradiating objects.
Artioukov IA, Vinogradov AV, Asadchikov VE, Kas'yanov YS, Serov RV, Fedorenko AI, Kondratenko VV, Yulin SA. Artioukov IA, et al. Among authors: yulin sa. Opt Lett. 1995 Dec 15;20(24):2451. doi: 10.1364/ol.20.002451. Opt Lett. 1995. PMID: 19865249 No abstract available.
Compact x-ray microscope for the water window based on a high brightness laser plasma source.
Legall H, Blobel G, Stiel H, Sandner W, Seim C, Takman P, Martz DH, Selin M, Vogt U, Hertz HM, Esser D, Sipma H, Luttmann J, Höfer M, Hoffmann HD, Yulin S, Feigl T, Rehbein S, Guttmann P, Schneider G, Wiesemann U, Wirtz M, Diete W. Legall H, et al. Among authors: yulin s. Opt Express. 2012 Jul 30;20(16):18362-9. doi: 10.1364/OE.20.018362. Opt Express. 2012. PMID: 23038387 Free article.
Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks.
Filatova EO, Kozhevnikov IV, Sokolov AA, Ubyivovk EV, Yulin S, Gorgoi M, Schäfers F. Filatova EO, et al. Among authors: yulin s. Sci Technol Adv Mater. 2012 Feb 2;13(1):015001. doi: 10.1088/1468-6996/13/1/015001. eCollection 2012 Feb. Sci Technol Adv Mater. 2012. PMID: 27877468 Free PMC article.