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Chemical state information of bulk specimens obtained by SEM-based soft-X-ray emission spectrometry.
Microsc Microanal. 2014 Jun;20(3):692-7. doi: 10.1017/S1431927614000439. Epub 2014 Mar 14.
Microsc Microanal. 2014.
PMID: 24625988
Laminar and blazed type holographic gratings for a versatile soft x-ray spectrograph attached to an electron microscope and their evaluation in the 50-200 eV range.
Imazono T, Koike M, Kawachi T, Hasegawa N, Koeda M, Nagano T, Sasai H, Oue Y, Yonezawa Z, Kuramoto S, Terauchi M, Takahashi H, Handa N, Murano T, Sano K.
Imazono T, et al. Among authors: yonezawa z.
Appl Opt. 2012 May 1;51(13):2351-60. doi: 10.1364/AO.51.002351.
Appl Opt. 2012.
PMID: 22614411
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A new grating X-ray spectrometer for 2-4 keV enabling a separate observation of In-Lβ and Sn-Lα emissions of indium tin oxide.
Terauchi M, Takahashi H, Handa N, Murano T, Koike M, Kawachi T, Imazono T, Hasegawa N, Koeda M, Nagano T, Sasai H, Oue Y, Yonezawa Z, Kuramoto S.
Terauchi M, et al. Among authors: yonezawa z.
Microscopy (Oxf). 2013 Jun;62(3):391-5. doi: 10.1093/jmicro/dfs129. Epub 2013 Jan 10.
Microscopy (Oxf). 2013.
PMID: 23307948
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