Experimental Limits on Solar Reflected Dark Matter with a New Approach on Accelerated-Dark-Matter-Electron Analysis in Semiconductors.
Zhang ZY, Yang LT, Yue Q, Kang KJ, Li YJ, An HP, C G, Chang JP, Chen YH, Cheng JP, Dai WH, Deng Z, Fang CH, Geng XP, Gong H, Guo QJ, Guo T, Guo XY, He L, He SM, Hu JW, Huang HX, Huang TC, Jiang L, Karmakar S, Li HB, Li HY, Li JM, Li J, Li QY, Li RMJ, Li XQ, Li YL, Liang YF, Liao B, Lin FK, Lin ST, Liu JX, Liu SK, Liu YD, Liu Y, Liu YY, Ma H, Mao YC, Nie QY, Ning JH, Pan H, Qi NC, Ren J, Ruan XC, Singh MK, Sun TX, Tang CJ, Tian Y, Wang GF, Wang JZ, Wang L, Wang Q, Wang YF, Wang YX, Wong HT, Wu SY, Wu YC, Xing HY, Xu R, Xu Y, Xue T, Yan YL, Yi N, Yu CX, Yu HJ, Yue JF, Zeng M, Zeng Z, Zhang BT, Zhang FS, Zhang L, Zhang ZH, Zhao JZ, Zhao KK, Zhao MG, Zhou JF, Zhou ZY, Zhu JJ; CDEX Collaboration.
Zhang ZY, et al. Among authors: yi n.
Phys Rev Lett. 2024 Apr 26;132(17):171001. doi: 10.1103/PhysRevLett.132.171001.
Phys Rev Lett. 2024.
PMID: 38728703
