Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction.
Lee H, Shin J, Cho DH, Jung C, Sung D, Ahn K, Nam D, Kim S, Kim KS, Park SY, Fan J, Jiang H, Kang HC, Tono K, Yabashi M, Ishikawa T, Noh DY, Song C.
Lee H, et al. Among authors: yabashi m.
J Synchrotron Radiat. 2020 Jan 1;27(Pt 1):17-24. doi: 10.1107/S1600577519015443. Epub 2020 Jan 1.
J Synchrotron Radiat. 2020.
PMID: 31868731