Wiezorek JMK - Search Results

1

Dislocation nucleation facilitated by atomic segregation.

Zou L, Yang C, Lei Y, Zakharov D, Wiezorek JMK, Su D, Yin Q, Li J, Liu Z, Stach EA, Yang JC, Qi L, Wang G, Zhou G. Zou L, et al. Among authors: wiezorek jmk. Nat Mater. 2018 Jan;17(1):56-63. doi: 10.1038/nmat5034. Epub 2017 Nov 27. Nat Mater. 2018. PMID: 29180772

2

Dislocation dynamics in nanocrystalline nickel.

Shan ZW, Wiezorek JM, Stach EA, Follstaedt DM, Knapp JA, Mao SX. Shan ZW, et al. Phys Rev Lett. 2007 Mar 2;98(9):095502. doi: 10.1103/PhysRevLett.98.095502. Epub 2007 Mar 1. Phys Rev Lett. 2007. PMID: 17359167

3

Inter- and intra-agglomerate fracture in nanocrystalline nickel.

Shan Z, Knapp JA, Follstaedt DM, Stach EA, Wiezorek JM, Mao SX. Shan Z, et al. Phys Rev Lett. 2008 Mar 14;100(10):105502. doi: 10.1103/PhysRevLett.100.105502. Epub 2008 Mar 12. Phys Rev Lett. 2008. PMID: 18352202

4

Grain boundary-mediated plasticity in nanocrystalline nickel.

Shan Z, Stach EA, Wiezorek JM, Knapp JA, Follstaedt DM, Mao SX. Shan Z, et al. Science. 2004 Jul 30;305(5684):654-7. doi: 10.1126/science.1098741. Science. 2004. PMID: 15286368

5

Validation of density functionals for transition metals and intermetallics using data from quantitative electron diffraction.

Sang X, Kulovits A, Wang G, Wiezorek J. Sang X, et al. J Chem Phys. 2013 Feb 28;138(8):084504. doi: 10.1063/1.4792436. J Chem Phys. 2013. PMID: 23464157

6

Simultaneous determination of highly precise Debye-Waller factors and multiple structure factors for chemically ordered tetragonal FePd.

Sang X, Kulovits A, Wiezorek J. Sang X, et al. Acta Crystallogr A. 2011 May;67(Pt 3):229-39. doi: 10.1107/S0108767311005617. Epub 2011 Mar 24. Acta Crystallogr A. 2011. PMID: 21487181

7

Comparison of convergent beam electron diffraction methods for simultaneous structure and Debye Waller factor determination.

Sang X, Kulovits A, Wiezorek J. Sang X, et al. Ultramicroscopy. 2013 Mar;126:48-59. doi: 10.1016/j.ultramic.2012.12.016. Epub 2012 Dec 23. Ultramicroscopy. 2013. PMID: 23396103

8

Determination of Debye-Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientations.

Sang XH, Kulovits A, Wiezorek JM. Sang XH, et al. Acta Crystallogr A. 2010 Nov;66(Pt 6):685-93. doi: 10.1107/S010876731003446X. Epub 2010 Oct 14. Acta Crystallogr A. 2010. PMID: 20962378

9

Simultaneous determination of highly precise Debye-Waller factors and structure factors for chemically ordered NiAl.

Sang XH, Kulovits A, Wiezorek JM. Sang XH, et al. Acta Crystallogr A. 2010 Nov;66(Pt 6):694-702. doi: 10.1107/S0108767310034471. Epub 2010 Oct 14. Acta Crystallogr A. 2010. PMID: 20962379

10

Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope.

LaGrange T, Reed BW, Santala MK, McKeown JT, Kulovits A, Wiezorek JM, Nikolova L, Rosei F, Siwick BJ, Campbell GH. LaGrange T, et al. Micron. 2012 Nov;43(11):1108-20. doi: 10.1016/j.micron.2012.04.010. Epub 2012 Apr 28. Micron. 2012. PMID: 22595460

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