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Standards for the Characterization of Endurance in Resistive Switching Devices.
Lanza M, Waser R, Ielmini D, Yang JJ, Goux L, Suñe J, Kenyon AJ, Mehonic A, Spiga S, Rana V, Wiefels S, Menzel S, Valov I, Villena MA, Miranda E, Jing X, Campabadal F, Gonzalez MB, Aguirre F, Palumbo F, Zhu K, Roldan JB, Puglisi FM, Larcher L, Hou TH, Prodromakis T, Yang Y, Huang P, Wan T, Chai Y, Pey KL, Raghavan N, Dueñas S, Wang T, Xia Q, Pazos S. Lanza M, et al. Among authors: wang t. ACS Nano. 2021 Nov 23;15(11):17214-17231. doi: 10.1021/acsnano.1c06980. Epub 2021 Nov 3. ACS Nano. 2021. PMID: 34730935 Free article. Review.
Electroforming in Metal-Oxide Memristive Synapses.
Wang T, Shi Y, Puglisi FM, Chen S, Zhu K, Zuo Y, Li X, Jing X, Han T, Guo B, Bukvišová K, Kachtík L, Kolíbal M, Wen C, Lanza M. Wang T, et al. ACS Appl Mater Interfaces. 2020 Mar 11;12(10):11806-11814. doi: 10.1021/acsami.9b19362. Epub 2020 Feb 25. ACS Appl Mater Interfaces. 2020. PMID: 32036650
Graphene-enhanced infrared near-field microscopy.
Li P, Wang T, Böckmann H, Taubner T. Li P, et al. Among authors: wang t. Nano Lett. 2014 Aug 13;14(8):4400-5. doi: 10.1021/nl501376a. Epub 2014 Jul 17. Nano Lett. 2014. PMID: 25019504
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