Van Aert S - Search Results

1

Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions.

Zhang Z, Lobato I, De Backer A, Van Aert S, Nellist P. Zhang Z, et al. Among authors: van aert s. Ultramicroscopy. 2023 Apr;246:113671. doi: 10.1016/j.ultramic.2022.113671. Epub 2022 Dec 28. Ultramicroscopy. 2023. PMID: 36621195

2

Physical limits on atomic resolution.

Van Dyck D, Van Aert S, den Dekker AJ. Van Dyck D, et al. Among authors: van aert s. Microsc Microanal. 2004 Feb;10(1):153-7. doi: 10.1017/S143192760404036X. Microsc Microanal. 2004. PMID: 15306080 Free article. Review.

3

High-resolution electron microscopy and electron tomography: resolution versus precision.

Van Aert S, den Dekker AJ, Van Dyck D, van den Bos A. Van Aert S, et al. Among authors: van dyck d, van den bos a. J Struct Biol. 2002 Apr-May;138(1-2):21-33. doi: 10.1016/s1047-8477(02)00016-3. J Struct Biol. 2002. PMID: 12160698

4

Electronically coupled complementary interfaces between perovskite band insulators.

Huijben M, Rijnders G, Blank DH, Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Brinkman A, Hilgenkamp H. Huijben M, et al. Among authors: van tendeloo g, van aert s. Nat Mater. 2006 Jul;5(7):556-60. doi: 10.1038/nmat1675. Epub 2006 Jun 18. Nat Mater. 2006. PMID: 16783359

5

Resolution of coherent and incoherent imaging systems reconsidered - Classical criteria and a statistical alternative.

Van Aert S, Van Dyck D, den Dekker AJ. Van Aert S, et al. Among authors: van dyck d. Opt Express. 2006 May 1;14(9):3830-9. doi: 10.1364/oe.14.003830. Opt Express. 2006. PMID: 19516529 Free article.

6

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Van Dyck D, Van Aert S, den Dekker AJ, van den Bos A. Van Dyck D, et al. Among authors: van den bos a, van aert s. Ultramicroscopy. 2003 Dec;98(1):27-42. doi: 10.1016/S0304-3991(03)00023-8. Ultramicroscopy. 2003. PMID: 14609640

7

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D, Chen JH. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982521

8

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

9

Model-based quantification of EELS spectra: Including the fine structure.

Verbeeck J, Van Aert S, Bertoni G. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2006 Oct-Nov;106(11-12):976-80. doi: 10.1016/j.ultramic.2006.05.006. Epub 2006 Jun 30. Ultramicroscopy. 2006. PMID: 16843599

10

Electron channelling based crystallography.

Van Aert S, Geuens P, Van Dyck D, Kisielowski C, Jinschek JR. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2007 Jun-Jul;107(6-7):551-8. doi: 10.1016/j.ultramic.2006.04.031. Epub 2006 Dec 12. Ultramicroscopy. 2007. PMID: 17197092

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