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Formation of pure Cu nanocrystals upon post-growth annealing of Cu-C material obtained from focused electron beam induced deposition: comparison of different methods.
Szkudlarek A, Rodrigues Vaz A, Zhang Y, Rudkowski A, Kapusta C, Erni R, Moshkalev S, Utke I. Szkudlarek A, et al. Among authors: utke i. Beilstein J Nanotechnol. 2015 Jul 13;6:1508-17. doi: 10.3762/bjnano.6.156. eCollection 2015. Beilstein J Nanotechnol. 2015. PMID: 26425404 Free PMC article.
Continuum models of focused electron beam induced processing.
Toth M, Lobo C, Friedli V, Szkudlarek A, Utke I. Toth M, et al. Among authors: utke i. Beilstein J Nanotechnol. 2015 Jul 14;6:1518-40. doi: 10.3762/bjnano.6.157. eCollection 2015. Beilstein J Nanotechnol. 2015. PMID: 26425405 Free PMC article. Review.
Annealing-Based Electrical Tuning of Cobalt-Carbon Deposits Grown by Focused-Electron-Beam-Induced Deposition.
Puydinger Dos Santos MV, Velo MF, Domingos RD, Zhang Y, Maeder X, Guerra-Nuñez C, Best JP, Béron F, Pirota KR, Moshkalev S, Diniz JA, Utke I. Puydinger Dos Santos MV, et al. Among authors: utke i. ACS Appl Mater Interfaces. 2016 Nov 30;8(47):32496-32503. doi: 10.1021/acsami.6b12192. Epub 2016 Nov 16. ACS Appl Mater Interfaces. 2016. PMID: 27933832
48 results