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First measurements of optical emission spectroscopy on SPIDER negative ion source.
Rev Sci Instrum. 2020 Jan 1;91(1):013103. doi: 10.1063/1.5128900.
Rev Sci Instrum. 2020.
PMID: 32012555
First operation in SPIDER and the path to complete MITICA.
Serianni G, Toigo V, Bigi M, Boldrin M, Chitarin G, Dal Bello S, Grando L, Luchetta A, Marcuzzi D, Pasqualotto R, Pomaro N, Zaccaria P, Zanotto L, Agostinetti P, Agostini M, Antoni V, Aprile D, Barbisan M, Battistella M, Brombin M, Canton A, Cavazzana R, Dalla Palma M, Dan M, Delogu R, De Lorenzi A, De Muri M, Denizeau S, Fadone M, Fellin F, Ferro A, Gaio E, Gambetta G, Gasparini F, Gnesotto F, Jain P, Maistrello A, Manduchi G, Manfrin S, Marchiori G, Marconato N, Moresco M, Patton T, Pavei M, Peruzzo S, Pilan N, Pimazzoni A, Piovan R, Poggi C, Recchia M, Rigoni A, Rizzolo A, Rostagni G, Sartori E, Siragusa M, Sonato P, Spada E, Spagnolo S, Spolaore M, Taliercio C, Tinti P, Ugoletti M, Valente M, Zamengo A, Zaniol B, Zaupa M, Cavenago M, Boilson D, Rotti C, Veltri P, Chareyre J, Decamps H, Dremel M, Graceffa J, Geli F, Schunke B, Svensson L, Urbani M, Bonicelli T, Agarici G, Garbuglia A, Masiello A, Paolucci F, Simon M, Bailly-Maitre L, Bragulat E, Gomez G, Gutierrez D, Labate C, Mico G, Moreno JF, Pilard V, Kouzmenko G, Rousseau A, Chakraborty A, Baruah U, Patel H, Singh NP, Patel A, Dhola H, Raval B, Cristofaro S, Fantz U, Heinemann B, Kraus W, Kashiwagi M, Tobari H.
Serianni G, et al. Among authors: ugoletti m.
Rev Sci Instrum. 2020 Feb 1;91(2):023510. doi: 10.1063/1.5133076.
Rev Sci Instrum. 2020.
PMID: 32113382
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Visible cameras as a non-invasive diagnostic to study negative ion beam properties.
Ugoletti M, Agostini M, Barbisan M, Brombin M, Cavenago M, Delogu RS, Molon F, Pasqualotto R, Pimazzoni A, Serianni G.
Ugoletti M, et al.
Rev Sci Instrum. 2021 Apr 1;92(4):043302. doi: 10.1063/5.0038911.
Rev Sci Instrum. 2021.
PMID: 34243389
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Spatially resolved diagnostics for optimization of large ion beam sources.
Serianni G, Sartori E, Agnello R, Agostinetti P, Agostini M, Barbisan M, Brombin M, Candeloro V, Dalla Palma M, Delogu R, De Muri M, Fadone M, Mario I, Patton T, Pimazzoni A, Poggi C, Pouradier-Duteil B, Segalini B, Shepherd A, Spolaore M, Taliercio C, Ugoletti M, Veltri P, Zaniol B, Pasqualotto R.
Serianni G, et al. Among authors: ugoletti m.
Rev Sci Instrum. 2022 Aug 1;93(8):081101. doi: 10.1063/5.0084797.
Rev Sci Instrum. 2022.
PMID: 36050050
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Beam and installation improvements of the NIO1 ion source.
Cavenago M, Barbisan M, Delogu R, Pimazzoni A, Poggi C, Ugoletti M, Agostini M, Antoni V, Baltador C, Cervaro V, De Muri M, Giora D, Jain P, Laterza B, Maero G, Maniero M, Martini D, Minarello A, Ravarotto D, Recchia D, Rizzolo A, Romé M, Sartori E, Sattin M, Serianni G, Taccogna F, Valentino V, Variale V, Veltri P.
Cavenago M, et al. Among authors: ugoletti m.
Rev Sci Instrum. 2020 Jan 1;91(1):013316. doi: 10.1063/1.5128658.
Rev Sci Instrum. 2020.
PMID: 32012575
Free article.
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Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility.
Wimmer C, Bonomo F, Hurlbatt A, Schiesko L, Fantz U, Harder ND, Heinemann B, Mimo A, Orozco G, Agostini M, Barbisan M, Brombin M, Delogu R, Pimazzoni A, Poggi C, Serianni G, Ugoletti M, Veltri P.
Wimmer C, et al. Among authors: ugoletti m.
Rev Sci Instrum. 2020 Jan 1;91(1):013509. doi: 10.1063/1.5129336.
Rev Sci Instrum. 2020.
PMID: 32012577
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