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Damage evaluation in graphene underlying atomic layer deposition dielectrics.
Tang X, Reckinger N, Poncelet O, Louette P, Ureña F, Idrissi H, Turner S, Cabosart D, Colomer JF, Raskin JP, Hackens B, Francis LA. Tang X, et al. Among authors: turner s. Sci Rep. 2015 Aug 27;5:13523. doi: 10.1038/srep13523. Sci Rep. 2015. PMID: 26311131 Free PMC article.
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: an electron tomography and aberration-corrected high-resolution ADF-STEM study.
Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin JP, Pardoen T, Van Tendeloo G, Schryvers D. Idrissi H, et al. Among authors: turner s. Microsc Microanal. 2011 Dec;17(6):983-90. doi: 10.1017/S143192761101213X. Epub 2011 Oct 27. Microsc Microanal. 2011. PMID: 22030303
3,661 results