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Page 1
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Among authors: toleikis s. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter.
Hau-Riege SP, Chapman HN, Krzywinski J, Sobierajski R, Bajt S, London RA, Bergh M, Caleman C, Nietubyc R, Juha L, Kuba J, Spiller E, Baker S, Bionta R, Sokolowski Tinten K, Stojanovic N, Kjornrattanawanich B, Gullikson E, Plönjes E, Toleikis S, Tschentscher T. Hau-Riege SP, et al. Among authors: toleikis s. Phys Rev Lett. 2007 Apr 6;98(14):145502. doi: 10.1103/PhysRevLett.98.145502. Epub 2007 Apr 4. Phys Rev Lett. 2007. PMID: 17501285
Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses.
Chalupský J, Juha L, Hájková V, Cihelka J, Vysín L, Gautier J, Hajdu J, Hau-Riege SP, Jurek M, Krzywinski J, London RA, Papalazarou E, Pelka JB, Rey G, Sebban S, Sobierajski R, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Valentin C, Wabnitz H, Zeitoun P. Chalupský J, et al. Among authors: toleikis s. Opt Express. 2009 Jan 5;17(1):208-17. doi: 10.1364/oe.17.000208. Opt Express. 2009. PMID: 19129890 Free article.
Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.
Chalupský J, Juha L, Kuba J, Cihelka J, Hájková V, Koptyaev S, Krása J, Velyhan A, Bergh M, Caleman C, Hajdu J, Bionta RM, Chapman H, Hau-Riege SP, London RA, Jurek M, Krzywinski J, Nietubyc R, Pelka JB, Sobierajski R, Meyer-Ter-Vehn J, Tronnier A, Sokolowski-Tinten K, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Wabnitz H, Zastrau U. Chalupský J, et al. Among authors: toleikis s. Opt Express. 2007 May 14;15(10):6036-43. doi: 10.1364/oe.15.006036. Opt Express. 2007. PMID: 19546907 Free article.
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L, Burian T, Kozlova M, Fäustlin RR, Nagler B, Vinko SM, Whitcher T, Dzelzainis T, Renner O, Saksl K, Khorsand AR, Heimann PA, Sobierajski R, Klinger D, Jurek M, Pelka J, Iwan B, Andreasson J, Timneanu N, Fajardo M, Wark JS, Riley D, Tschentscher T, Hajdu J, Lee RW. Nelson AJ, et al. Among authors: toleikis s. Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271. Opt Express. 2009. PMID: 19907618 Free article.
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Among authors: toleikis s. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Spot size characterization of focused non-Gaussian X-ray laser beams.
Chalupský J, Krzywinski J, Juha L, Hájková V, Cihelka J, Burian T, Vysín L, Gaudin J, Gleeson A, Jurek M, Khorsand AR, Klinger D, Wabnitz H, Sobierajski R, Störmer M, Tiedtke K, Toleikis S. Chalupský J, et al. Among authors: toleikis s. Opt Express. 2010 Dec 20;18(26):27836-45. doi: 10.1364/OE.18.027836. Opt Express. 2010. PMID: 21197057 Free article.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources.
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Sobierajski R, et al. Among authors: toleikis s. Opt Express. 2011 Jan 3;19(1):193-205. doi: 10.1364/OE.19.000193. Opt Express. 2011. PMID: 21263557 Free article.
Decay of cystalline order and equilibration during the solid-to-plasma transition induced by 20-fs microfocused 92-eV free-electron-laser pulses.
Galtier E, Rosmej FB, Dzelzainis T, Riley D, Khattak FY, Heimann P, Lee RW, Nelson AJ, Vinko SM, Whitcher T, Wark JS, Tschentscher T, Toleikis S, Fäustlin RR, Sobierajski R, Jurek M, Juha L, Chalupsky J, Hajkova V, Kozlova M, Krzywinski J, Nagler B. Galtier E, et al. Among authors: toleikis s. Phys Rev Lett. 2011 Apr 22;106(16):164801. doi: 10.1103/PhysRevLett.106.164801. Epub 2011 Apr 18. Phys Rev Lett. 2011. PMID: 21599370
Creation and diagnosis of a solid-density plasma with an X-ray free-electron laser.
Vinko SM, Ciricosta O, Cho BI, Engelhorn K, Chung HK, Brown CR, Burian T, Chalupský J, Falcone RW, Graves C, Hájková V, Higginbotham A, Juha L, Krzywinski J, Lee HJ, Messerschmidt M, Murphy CD, Ping Y, Scherz A, Schlotter W, Toleikis S, Turner JJ, Vysin L, Wang T, Wu B, Zastrau U, Zhu D, Lee RW, Heimann PA, Nagler B, Wark JS. Vinko SM, et al. Among authors: toleikis s. Nature. 2012 Jan 25;482(7383):59-62. doi: 10.1038/nature10746. Nature. 2012. PMID: 22278059
58 results