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Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling.
Nanomaterials (Basel). 2020 Jun 26;10(6):1247. doi: 10.3390/nano10061247.
Nanomaterials (Basel). 2020.
PMID: 32604948
Free PMC article.
Versatile atomic force microscopy setup combined with micro-focused X-ray beam.
Slobodskyy T, Zozulya AV, Tholapi R, Liefeith L, Fester M, Sprung M, Hansen W.
Slobodskyy T, et al. Among authors: tholapi r.
Rev Sci Instrum. 2015 Jun;86(6):065104. doi: 10.1063/1.4922605.
Rev Sci Instrum. 2015.
PMID: 26133870
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