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Comparison of Three E-Beam Techniques for Electric Field Imaging and Carrier Diffusion Length Measurement on the Same Nanowires.
Nano Lett. 2016 May 11;16(5):2938-44. doi: 10.1021/acs.nanolett.5b04710. Epub 2016 Apr 29.
Nano Lett. 2016.
PMID: 27105083
Direct imaging of p-n junction in core-shell GaN wires.
Tchoulfian P, Donatini F, Levy F, Dussaigne A, Ferret P, Pernot J.
Tchoulfian P, et al.
Nano Lett. 2014 Jun 11;14(6):3491-8. doi: 10.1021/nl5010493. Epub 2014 May 29.
Nano Lett. 2014.
PMID: 24837761
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Nanoscale Dopant Profiling of Individual Semiconductor Wires by Capacitance-Voltage Measurement.
Lassiaz T, Tchoulfian P, Donatini F, Brochet J, Parize R, Jacopin G, Pernot J.
Lassiaz T, et al. Among authors: tchoulfian p.
Nano Lett. 2021 Apr 28;21(8):3372-3378. doi: 10.1021/acs.nanolett.0c04491. Epub 2021 Apr 7.
Nano Lett. 2021.
PMID: 33825480
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Spectroscopic XPEEM of highly conductive SI-doped GaN wires.
Renault O, Morin J, Tchoulfian P, Chevalier N, Feyer V, Pernot J, Schneider CM.
Renault O, et al. Among authors: tchoulfian p.
Ultramicroscopy. 2015 Dec;159 Pt 3:476-81. doi: 10.1016/j.ultramic.2015.05.007. Epub 2015 May 14.
Ultramicroscopy. 2015.
PMID: 26004038
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