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Year | Number of Results |
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2011 | 1 |
2019 | 1 |
2020 | 1 |
2022 | 1 |
2024 | 0 |
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Reduction of White Spot Defects in CMOS Image Sensors Fabricated Using Epitaxial Silicon Wafer with Proximity Gettering Sinks by CH2P Molecular Ion Implantation.
Sensors (Basel). 2022 Oct 28;22(21):8258. doi: 10.3390/s22218258.
Sensors (Basel). 2022.
PMID: 36365955
Free PMC article.
Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers.
Onaka-Masada A, Kadono T, Okuyama R, Hirose R, Kobayashi K, Suzuki A, Koga Y, Kurita K.
Onaka-Masada A, et al. Among authors: kadono t.
Sensors (Basel). 2020 Nov 19;20(22):6620. doi: 10.3390/s20226620.
Sensors (Basel). 2020.
PMID: 33228009
Free PMC article.
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Proximity Gettering Design of Hydrocarbon⁻Molecular⁻Ion⁻Implanted Silicon Wafers Using Dark Current Spectroscopy for CMOS Image Sensors.
Kurita K, Kadono T, Shigematsu S, Hirose R, Okuyama R, Onaka-Masada A, Okuda H, Koga Y.
Kurita K, et al. Among authors: kadono t.
Sensors (Basel). 2019 May 4;19(9):2073. doi: 10.3390/s19092073.
Sensors (Basel). 2019.
PMID: 31060216
Free PMC article.
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Magnetic sponge prepared with an alkanedithiol-bridged network of nanomagnets.
Ito Y, Miyazaki A, Takai K, Sivamurugan V, Maeno T, Kadono T, Kitano M, Ogawa Y, Nakamura N, Hara M, Valiyaveettil S, Enoki T.
Ito Y, et al. Among authors: kadono t.
J Am Chem Soc. 2011 Aug 3;133(30):11470-3. doi: 10.1021/ja204617a. Epub 2011 Jul 13.
J Am Chem Soc. 2011.
PMID: 21732688
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