Szkudlarek A - Search Results

1

Nitrogen Dioxide Sensing Using Multilayer Structure of Reduced Graphene Oxide and α-Fe₂O₃.

Pisarkiewicz T, Maziarz W, Małolepszy A, Stobiński L, Michoń DA, Szkudlarek A, Pisarek M, Kanak J, Rydosz A. Pisarkiewicz T, et al. Among authors: szkudlarek a. Sensors (Basel). 2021 Feb 2;21(3):1011. doi: 10.3390/s21031011. Sensors (Basel). 2021. PMID: 33540780 Free PMC article.

2

Gas-Sensing Performance of M-Doped CuO-Based Thin Films Working at Different Temperatures upon Exposure to Propane.

Rydosz A, Szkudlarek A. Rydosz A, et al. Among authors: szkudlarek a. Sensors (Basel). 2015 Aug 14;15(8):20069-85. doi: 10.3390/s150820069. Sensors (Basel). 2015. PMID: 26287204 Free PMC article.

3

Comparative study of post-growth annealing of Cu(hfac)₂, Co₂(CO)₈ and Me₂Au(acac) metal precursors deposited by FEBID.

Puydinger Dos Santos MV, Szkudlarek A, Rydosz A, Guerra-Nuñez C, Béron F, Pirota KR, Moshkalev S, Diniz JA, Utke I. Puydinger Dos Santos MV, et al. Among authors: szkudlarek a. Beilstein J Nanotechnol. 2018 Jan 9;9:91-101. doi: 10.3762/bjnano.9.11. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 29441254 Free PMC article.

4

Graphene removal by water-assisted focused electron-beam-induced etching - unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO₂ substrates.

Szkudlarek A, Michalik JM, Serrano-Esparza I, Nováček Z, Novotná V, Ozga P, Kapusta C, De Teresa JM. Szkudlarek A, et al. Beilstein J Nanotechnol. 2024 Feb 7;15:190-198. doi: 10.3762/bjnano.15.18. eCollection 2024. Beilstein J Nanotechnol. 2024. PMID: 38352720 Free PMC article.

5

Determination of the surface diffusion coefficient and the residence time of adsorbates via local focused electron beam induced chemical vapour deposition.

Szkudlarek A, Gabureac M, Utke I. Szkudlarek A, et al. J Nanosci Nanotechnol. 2011 Sep;11(9):8074-8. doi: 10.1166/jnn.2011.5066. J Nanosci Nanotechnol. 2011. PMID: 22097532

6

Toward ultraflat surface morphologies during focused electron beam induced nanosynthesis: disruption origins and compensation.

Winkler R, Szkudlarek A, Fowlkes JD, Rack PD, Utke I, Plank H. Winkler R, et al. Among authors: szkudlarek a. ACS Appl Mater Interfaces. 2015 Feb 11;7(5):3289-97. doi: 10.1021/am508052k. Epub 2015 Jan 28. ACS Appl Mater Interfaces. 2015. PMID: 25591033

7

Formation of pure Cu nanocrystals upon post-growth annealing of Cu-C material obtained from focused electron beam induced deposition: comparison of different methods.

Szkudlarek A, Rodrigues Vaz A, Zhang Y, Rudkowski A, Kapusta C, Erni R, Moshkalev S, Utke I. Szkudlarek A, et al. Beilstein J Nanotechnol. 2015 Jul 13;6:1508-17. doi: 10.3762/bjnano.6.156. eCollection 2015. Beilstein J Nanotechnol. 2015. PMID: 26425404 Free PMC article.

8

Continuum models of focused electron beam induced processing.

Toth M, Lobo C, Friedli V, Szkudlarek A, Utke I. Toth M, et al. Among authors: szkudlarek a. Beilstein J Nanotechnol. 2015 Jul 14;6:1518-40. doi: 10.3762/bjnano.6.157. eCollection 2015. Beilstein J Nanotechnol. 2015. PMID: 26425405 Free PMC article. Review.

9

Correction: Formation of pure Cu nanocrystals upon post-growth annealing of Cu-C material obtained from focused electron beam induced deposition: comparison of different methods.

Szkudlarek A, Vaz AR, Zhang Y, Rudkowski A, Kapusta C, Erni R, Moshkalev S, Utke I. Szkudlarek A, et al. Beilstein J Nanotechnol. 2015 Sep 21;6:1935-6. doi: 10.3762/bjnano.6.196. eCollection 2015. Beilstein J Nanotechnol. 2015. PMID: 26665063 Free PMC article.

10

The nanoscale implications of a molecular gas beam during electron beam induced deposition.

Winkler R, Fowlkes J, Szkudlarek A, Utke I, Rack PD, Plank H. Winkler R, et al. Among authors: szkudlarek a. ACS Appl Mater Interfaces. 2014 Feb 26;6(4):2987-95. doi: 10.1021/am405591d. Epub 2014 Feb 17. ACS Appl Mater Interfaces. 2014. PMID: 24502299

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